Detection of SAO faults on selected I/O wires of a VLSI circuit for BCD-to-excess-3 code converter

Book References

  1. Digital Logic and Computer Design by Morris Mano 4th Edition.
  2. Digital Design: An Embedded Systems Approach Using VERILOG by Ashenden.
  3. Digital System Test and Testable Design, by Zainalabedin Navabi.

Web References

  1. https://electricalworkbook.com/bcd-to-excess-3-code-converter-circuit/
  2. https://accendoreliability.com/digital-circuits-stuck-fault-model/