C-V characterization of PMOS capacitors            

Procedure

Fig. 1. MOS C/V curve

  1. Set Material Parameters:
    • Choose the semiconductor material (Si, Ge, GaAs) for the simulation by clicking on the respective button.
    • Enter the work function of the metal gate, ϕm, in electron volts (eV).
    • Input the electron affinity of the semiconductor, χs, in eV.
  2. Define Oxide Properties:
    • Enter the oxide thickness, tox, in nanometers (nm).
    • Specify the relative permittivity of the oxide, εox.
  3. Set Semiconductor Parameters:
    • Specify the relative permittivity of the semiconductor, εsemi.
    • Enter the effective density of states in the conduction band, Nc, and in the valence band, Nv, in 1/cm3.
    • Set the temperature, T, in Kelvin (K).
    • Input the acceptor doping concentration, NA, in 1/cm3.
  4. Calculate Energy Bandgap:
    • Use the given formula to calculate the energy bandgap, Eg, based on the temperature.
  5. Submit the Parameters:
    • Click the "Submit" button to apply the parameters and perform the simulation.
  6. Analyze the Results:
    • Observe the Q-V (Charge-Voltage) and C-V (Capacitance-Voltage) plots generated from the simulation.
    • Examine key parameters displayed, such as oxide capacitance (Cox), threshold voltage (VT), flat-band voltage (Vfb), and others.
    • Interpret the different regions in the C-V curve: accumulation, depletion, and inversion, to understand the behavior of the PMOS capacitor.