C-V characterization of PMOS capacitors
1. What does the C-V characterization of a PMOS capacitor measure?
2. In which region does the capacitance approach the oxide capacitance (C_ox) in a PMOS capacitor?
3. What happens to the capacitance in the depletion region of a PMOS capacitor?
4. What does the threshold voltage (V_T) indicate in the C-V characterization of a PMOS capacitor?
5. How does the doping concentration affect the C-V curve of a PMOS capacitor?
6. What parameter can be extracted from the slope of the C-V curve in the depletion region?
7. Which of the following conditions corresponds to the inversion region of a PMOS capacitor?
8. What is the significance of the flat-band voltage (V_fb) in C-V characterization?
9. How is the oxide capacitance (C_ox) related to the oxide thickness (t_ox)?
10. In a PMOS capacitor, what type of carriers accumulate at the semiconductor-oxide interface under a high negative gate voltage?