References

Books

  1. Ian Getreu, Modeling the Bipolar Transistor, Tektronix, Inc., 1976. (This is the definitive, classic reference. It dedicates specific sections to reverse-active measurements and extracting parameters like $BR$, $ISC$, $NC$, and $IKR$ from reverse Gummel plots.)

  2. G. Massobrio and P. Antognetti, Semiconductor Device Modeling with SPICE, 2nd ed., McGraw-Hill, 1993. (This book thoroughly details the Gummel-Poon model, including the reverse-active parameters and their physical significance, which are measured using the reverse Gummel plot.)

  3. S. M. Sze and Kwok K. Ng, Physics of Semiconductor Devices, 3rd ed., Wiley, 2006. (Provides the fundamental semiconductor physics that explains why the reverse characteristics ($I_e$, $I_b$ vs. $V_{bc}$) differ from the forward characteristics, particularly the reasons for a low $BR$.)

Video Lectures