Aim
Theory
Pretest
Procedure
Simulation
Posttest
References
Contributors
Feedback
Detection of both SA0 and SA1 faults on a VLSI circuit that represents 3–input ODD function
Aim
Theory
Pretest
Procedure
Simulation
Posttest
References
Contributors
Feedback
Detection of both SA0 and SA1 faults on a VLSI circuit that represents 3–input ODD function