Sample Preparation for TEM analysis (Bulk metal, Powder sample, Brittle material)
POWDER SAMPLE:
- Mill the powder sample into very fine size (orders of nm)
- Suspend the powders in ethanol (alcohol medium)
- Ultrasonicate to disperse the powder till a clear solution is obtained
- Using a dropper, dispense few drops of suspension onto the carbon coated copper grid.
- Please the grid on TEM sample holder for observation.
BULK SAMPLE: - Take the bulk sample, and slice it into thickness of < 100 µm
- Punch a 3 mm disc from the sheet
- Use dimple grinder (either one side or both sides) to bring it down to thickness of 2-5 µm
- Use electrochemical etching for getting a perforation on the sample
- Follow it up (optional, or in place of electrochemical etching) with ion-beam milling.
- The entire sample can now be placed on TEM holder (and will not require a grid for support).
BRITTLE SAMPLE:
- Crush the brittle material and follow the powder process. Here a copper grid (with or without carbon coating) will be needed.
- For observing bulk sample, the grinding of the sample should be done to bring it down to < 100 µm thickness.
- Now punch the 3 mm disc from the sheet.
- Use dimple grinder for thinning it down to 2-5 µm.
- Use ion-beam milling process for getting a thin region (electron transparent) for observation under TEM. The entire sample can be used stand alone (without any support grid) for imaging.