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Sample Preparation for TEM analysis (Bulk metal, Powder sample, Brittle material)

a: A-1, B-2, C-3, D-4 b: A-2, B-1, C-4, D-3 c: A-4, B-2, C-3, D-1 d: A-2, B-4, C-1, D-3

2. Double side dimpling of sample has advantage of

a: Providing very sharp and narrow region of observation b: Providing very shallow and wide region of observation c: Minimised sample damage d: Easier sample handling

3. The nano-sized powders may be observed under TEM by which technique:

a: Using few drops of powder-suspension on carbon coated copper grid b: By conventional process of slicing, punching, dimpling, and ion beam milling c: By putting nano-powders on copper grid d: By making slurry/paste of powders on carbon coated copper grid

4. The powder samples are suspended in the solution by

a: Magnetic stirrer b: Electric Heater c: Gravity shaker d: Ultrasonication

5. A nanocrystalline powder material is usually supported on TEM holder for TEM imaging

a: Using copper grid b: Dispersing on carbon tape c: as stand-alone sample d: On carbon coated copper grid

6. Brittle materials are prepared for TEM imaging using

a: Ion beam milling b: Electrochemical Etching c: Physical Vapor deposition d: Disc-slicing

7. Double side dimpling is preferred over one-sided dimpling because

a: Double side dimpling has double efficiency of operation b: Double side dimpling promotes less damage to material c: Double side dimpling provides more observable area for imaging d: Double side dimpling reduces charging on the TEM sample

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