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Aim
Theory
Pretest
Procedure
Simulation
Posttest
References
Contributors
Feedback
Detection of SA1 faults on selected I/O wires of a VLSI circuit for BCD-to-excess-3 code converter
Aim
To detect SA1 faults on selected I/O wires of a BCD to excess-3 code converter.
To detect the fault for each output function.