Step 1: Set the value of the wavelength (λ), angle (θ), and width of the slit (d) using the controls provided in the simulation.

Step 2: Click on either Diffraction Pattern or Intensity Profile to choose the display mode.

Step 3: When clicking on Diffraction Pattern, the pattern appearing on the screen is due to the single-slit aperture, as shown in Fig. 2.

Fig. 2 — Diffraction Pattern due to Single-Slit Aperture

Step 4: If Intensity Profile is clicked, the pattern observed is as shown in Fig. 3. When k is set to 1, it will display two intensity profiles (one on each side of the central maximum).

Fig. 3 — Intensity Profile due to Single-Slit Aperture

Step 5: Change the wavelength (λ) and the slit width (d) to observe different pattern formations. This provides an understanding of how the pattern varies with these parameters.

Step 6: Take 5–10 readings for different parameter values and record them in Table 1 and Table 2 below.

Table 1: Slit Width vs. Order of Minima

Fixed: Wavelength λ = 600 nm
Formula: d sinθ = kλ  ⟹  θ = arcsin(kλ / d)

Table 2: Angle of Observation vs. Relative Intensity

Fixed: Slit width d = 1000 nm, Wavelength λ = 600 nm
Formula: I/I₀ = (sinα / α)², where α = πd sinθ / λ