References

Books

  1. S. M. Sze and Kwok K. Ng, Physics of Semiconductor Devices, 3rd ed., Wiley, 2006.(Provides the fundamental physics behind depletion and diffusion capacitance, which is the basis for the C-V model.)

  2. Dieter K. Schroder, Semiconductor Material and Device Characterization, 3rd ed., Wiley-IEEE Press, 2006.(This is the definitive guide on device characterization. Chapter 2 is dedicated to C-V measurements and explains in detail how to extract parameters like $VJ$, $CJO$, and doping profiles from $1/C^2$ plots.)

  3. G. Massobrio and P. Antognetti, Semiconductor Device Modeling with SPICE, 2nd ed., McGraw-Hill, 1993.(This classic text explains the specific SPICE equations for both depletion ($CJO$, $VJ$, $M$, $FC$) and diffusion ($TT$) capacitance and how they form the complete model.)

Video Lectures