Detection of both SA0 and SA1 faults on a VLSI circuit that represents 3–input EVEN function
References
- Digital systems: principles and applications (5th ed.) January 1991,Ronald J Tocci.
- Logic and Computer Design Fundamentals, Charles Kime & Thomas Kaminski, 2004 Pearson Education Inc.
- Digital System Test and Testable Design, by Zainalabedin Navabi.