Step 1: Select the preferred Language (English or Hindi) from the language selection option.

Step 2: Switch on the TEM machine and allow the system to initialize.

Step 3: Click on the Remove Sample Holder button to safely remove the sample holder from the machine.

Step 4: Drag and drop the sample onto the Sample Holder.

Step 5: Click on the Insert Sample Holder button to reinsert the sample holder into the TEM.

Step 6: Set the Vacuum Level to LV and click Set to apply the configuration.

Step 7: Adjust the Accelerating Voltage within the range of 100 kV to 200 kV, then click Set.

Step 8: Select the required Material for analysis.

Step 9: Switch ON the Electron Beam to begin observation.

Step 10: Choose the appropriate Defect Type to observe the corresponding image on the right-side image panel.