Advanced Imaging Modes of SEM ( BSE (Compositional & Topography) , TLD, Multiple Elemental mapping)
- Book on Scanning electron microscopy and X-Ray microanalysis by J. I. Goldstein, Dale E. Newbury, J. R. Micheal, N. W. M. Ritchie, J. H. J. Scott, D. C. Joy
- Goodhew, P.J., Humphreys J. and Beanland, R., “Electron Microscopy and Analysis”, Taylor and Francis, Third edition, 2000.